SEM and EPMA studies of oval defects on MBE GaAs layers: Fid-Bau Portal

SEM and EPMA studies of oval defects on MBE GaAs layers

Kadhim, N. J. / Mukherjee, D.

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SEM and EPMA studies of oval defects on MBE GaAs layers

Kadhim, N. J. / Mukherjee, D.

SEM and EPMA studies of oval defects on MBE GaAs layers

Kadhim, N. J. / Mukherjee, D.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

SEM and EPMA studies of oval defects on MBE GaAs layers

Contributors:

Kadhim, N. J. (author) / Mukherjee, D. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 17 ; 595-598

Publication date:

1998-01-01

Size:

4 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Lazzarini, L. / Salviati, G. / Franchi, S. et al. | British Library Online Contents | 2001

Growth model of oval defect structures in MBE GaAs layers

Kadhim, N. J. / Mukherjee, D. | British Library Online Contents | 1999

X-Ray DCD and EPMA Measurements of A1 Concentration in Epitaxial Al~xGa~1~-~xAs/GaAs Layers

Macquistan, D. A. / Bassignana, I. C. / SpringThorpe, A. J. et al. | British Library Online Contents | 1993

Defects in Thick Epitaxial Gaas Layers

Samic, H. / Bourgoin, J. C. | British Library Online Contents | 1997

Investigation of oval defects in (In)Ga(Al)As/GaAs heterostructures by spatially resolved photoluminescence and micro-cathodoluminescence

Szerling, A. / Kosiel, K. / Wojcik-Jedlinska, A. et al. | British Library Online Contents | 2006