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Investigation of whisker defects on molecular beam epitaxy grown GaAs layers

Kadhim, N. J. / Mukherjee, D.

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Investigation of whisker defects on molecular beam epitaxy grown GaAs layers

Kadhim, N. J. / Mukherjee, D.

Investigation of whisker defects on molecular beam epitaxy grown GaAs layers

Kadhim, N. J. / Mukherjee, D.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Investigation of whisker defects on molecular beam epitaxy grown GaAs layers

Contributors:

Kadhim, N. J. (author) / Mukherjee, D. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 15 ; 1330-1331

Publication date:

1996-01-01

Size:

2 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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