A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Determination of the Phase Composition of Thin-Film Structures for Microelectronics Using Auger Spectra
Determination of the Phase Composition of Thin-Film Structures for Microelectronics Using Auger Spectra
Determination of the Phase Composition of Thin-Film Structures for Microelectronics Using Auger Spectra
Beshenkov, V. G. (author)
INDUSTRIAL LABORATORY C/C OF ZAVODSKAIA LABORATORIIA ; 62 ; 81-85
1996-01-01
5 pages
Article (Journal)
English
DDC:
607.2
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