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    Ellipsometric Studies of Polycrystalline Molybdenum Silicide Thin Films

    New search for: Srinivas, G.
    New search for: Vankar, V. D.

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    Ellipsometric Studies of Polycrystalline Molybdenum Silicide Thin Films

    New search for: Srinivas, G.
    New search for: Vankar, V. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ellipsometric Studies of Polycrystalline Molybdenum Silicide Thin Films

    New search for: Srinivas, G.
    New search for: Vankar, V. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Ellipsometric Studies of Polycrystalline Molybdenum Silicide Thin Films

    Contributors:

    Srinivas, G. (author) / Vankar, V. D. (author)

    Published in:

    MATERIALS RESEARCH BULLETIN ; 31 ; 1331-1340

    Publication date:

    1996-01-01

    Size:

    10 pages

    ISSN:

    0025-5408

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11 / 620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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