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Tracing the Ti-silicide formation by in situ ellipsometric measurements
Tracing the Ti-silicide formation by in situ ellipsometric measurements
Tracing the Ti-silicide formation by in situ ellipsometric measurements
Stark, T. (author) / Hergert, F. (author) / Ley, L. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 6 ; 77-83
2003-01-01
7 pages
Article (Journal)
English
DDC:
621.38152
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