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Damage profiling of Ar^+ sputtered Si(100) surface by medium energy ion scattering spectroscopy
Damage profiling of Ar^+ sputtered Si(100) surface by medium energy ion scattering spectroscopy
Damage profiling of Ar^+ sputtered Si(100) surface by medium energy ion scattering spectroscopy
Lee, J. C. (author) / Jeong, C. S. (author) / Kang, H. J. (author) / Kim, H. K. (author) / Moon, D. W. (author) / Feldman, L. C. / Nishizawa, J. / Van der Weg, W. F.
1996-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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Damage profiling of Ar^+ sputtered Si(100) surface by medium energy ion scattering spectroscopy
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