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    Quantitative analysis of degradation in Schottky diode characteristics induced by single ion implantation

    New search for: Koyama, M.
    New search for: Akita, Y.
    New search for: Cheong, C.
    New search for: Koh, M.
    New search for: Matsukawa, T.
    New search for: Horita, K.
    New search for: Shigeta, B.
    New search for: Ohdomari, I.

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    Quantitative analysis of degradation in Schottky diode characteristics induced by single ion implantation

    New search for: Koyama, M.
    New search for: Akita, Y.
    New search for: Cheong, C.
    New search for: Koh, M.
    New search for: Matsukawa, T.
    New search for: Horita, K.
    New search for: Shigeta, B.
    New search for: Ohdomari, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Quantitative analysis of degradation in Schottky diode characteristics induced by single ion implantation

    New search for: Koyama, M.
    New search for: Akita, Y.
    New search for: Cheong, C.
    New search for: Koh, M.
    New search for: Matsukawa, T.
    New search for: Horita, K.
    New search for: Shigeta, B.
    New search for: Ohdomari, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Quantitative analysis of degradation in Schottky diode characteristics induced by single ion implantation

    Contributors:

    Koyama, M. (author) / Akita, Y. (author) / Cheong, C. (author) / Koh, M. (author) / Matsukawa, T. (author) / Horita, K. (author) / Shigeta, B. (author) / Ohdomari, I. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 104/105 ; 253-256

    Publication date:

    1996-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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