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    Hot-electron scattering at Au/Si(100) Schottky interfaces measured by temperature dependent ballistic electron emission microscopy

    New search for: Ventrice, C. A.
    New search for: LaBella, V. P.
    New search for: Ramaswamy, G.
    New search for: Yu, H.-P.
    New search for: Schowalter, L. J.

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    Hot-electron scattering at Au/Si(100) Schottky interfaces measured by temperature dependent ballistic electron emission microscopy

    New search for: Ventrice, C. A.
    New search for: LaBella, V. P.
    New search for: Ramaswamy, G.
    New search for: Yu, H.-P.
    New search for: Schowalter, L. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Hot-electron scattering at Au/Si(100) Schottky interfaces measured by temperature dependent ballistic electron emission microscopy

    New search for: Ventrice, C. A.
    New search for: LaBella, V. P.
    New search for: Ramaswamy, G.
    New search for: Yu, H.-P.
    New search for: Schowalter, L. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Hot-electron scattering at Au/Si(100) Schottky interfaces measured by temperature dependent ballistic electron emission microscopy

    Contributors:

    Ventrice, C. A. (author) / LaBella, V. P. (author) / Ramaswamy, G. (author) / Yu, H.-P. (author) / Schowalter, L. J. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 104/105 ; 274-281

    Publication date:

    1996-01-01

    Size:

    8 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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