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Hot-electron scattering at Au/Si(100) Schottky interfaces measured by temperature dependent ballistic electron emission microscopy
Hot-electron scattering at Au/Si(100) Schottky interfaces measured by temperature dependent ballistic electron emission microscopy
Hot-electron scattering at Au/Si(100) Schottky interfaces measured by temperature dependent ballistic electron emission microscopy
Ventrice, C. A. (author) / LaBella, V. P. (author) / Ramaswamy, G. (author) / Yu, H.-P. (author) / Schowalter, L. J. (author)
APPLIED SURFACE SCIENCE ; 104/105 ; 274-281
1996-01-01
8 pages
Article (Journal)
English
DDC:
621.35
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