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Hot-electron scattering at Au/Si(100) Schottky interfaces measured by temperature dependent ballistic electron emission microscopy
Hot-electron scattering at Au/Si(100) Schottky interfaces measured by temperature dependent ballistic electron emission microscopy
Hot-electron scattering at Au/Si(100) Schottky interfaces measured by temperature dependent ballistic electron emission microscopy
Ventrice, C. A. (Autor:in) / LaBella, V. P. (Autor:in) / Ramaswamy, G. (Autor:in) / Yu, H.-P. (Autor:in) / Schowalter, L. J. (Autor:in)
APPLIED SURFACE SCIENCE ; 104/105 ; 274-281
01.01.1996
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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