Search

High resolution electron microscopy study of nickel silicide - silicon interface grown by molecular beam epitaxy

Feng, Y. Z. / Wu, Z. Q.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

High resolution electron microscopy study of nickel silicide - silicon interface grown by molecular beam epitaxy

Feng, Y. Z. / Wu, Z. Q.

High resolution electron microscopy study of nickel silicide - silicon interface grown by molecular beam epitaxy

Feng, Y. Z. / Wu, Z. Q.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

High resolution electron microscopy study of nickel silicide - silicon interface grown by molecular beam epitaxy

Contributors:

Feng, Y. Z. (author) / Wu, Z. Q. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 15 ; 2000-2001

Publication date:

1996-01-01

Size:

2 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Sticht, A. / Markmann, M. / Brunner, K. et al. | British Library Online Contents | 2002

Transmission electron microscopy study on GaAs grown by molecular beam epitaxy at low substrate temperature

Chen, H. / Li, F. H. / Zhou, J. M. et al. | British Library Online Contents | 1992

Microstructural characterization of ordered nickel silicide structures grown on (111) nickel silicide films

Ho, H. L. / Bauer, C. L. / Mahajan, S. et al. | British Library Online Contents | 1996

An interface study of crystalline Fe/Ge multilayers grown by molecular beam epitaxy

Tari, S. | British Library Online Contents | 2011

Characterization of reactions at titanium/nickel silicide interface using X-ray photoelectron spectroscopy and transmission electron microscopy

Zhao, J. / Lu, J. P. / Xu, Y. Q. et al. | British Library Online Contents | 2003