Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    EBIC defect characterisation: state of understanding and problems of interpretation

    New search for: Kittler, M.
    New search for: Seifert, W.
    New search for: Balkanski, M.
    New search for: Kamimura, H.
    New search for: Mahajan, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    EBIC defect characterisation: state of understanding and problems of interpretation

    New search for: Kittler, M.
    New search for: Seifert, W.
    New search for: Balkanski, M.
    New search for: Kamimura, H.
    New search for: Mahajan, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    EBIC defect characterisation: state of understanding and problems of interpretation

    New search for: Kittler, M.
    New search for: Seifert, W.
    New search for: Balkanski, M.
    New search for: Kamimura, H.
    New search for: Mahajan, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    EBIC defect characterisation: state of understanding and problems of interpretation

    Contributors:

    Kittler, M. (author) / Seifert, W. (author) / Balkanski, M. / Kamimura, H. / Mahajan, S.

    Published in:

    Solid-State Materials for Advanced Technology ; 8-13

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 42

    Publication date:

    1996-01-01

    Size:

    6 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    EBIC studies of grain boundaries

    Holt, D. B. / Raza, B. / Wojcik, A. | British Library Online Contents | 1996

    Conventional EBIC versus MOS/EBIC study of electrically active defects in Si and SOI

    Bondarenko, I. / Kirk, H. / Kononchuk, O. et al. | British Library Online Contents | 1996

    SCH laser recombination rate from EBIC profiles

    Romero, M. J. / Araujo, D. / Garcia, R. | British Library Online Contents | 1996

    EBIC mode characterization of transport properties on laser heterostructures

    Romero, M. J. / Araujo, D. / Lambkin, J. D. et al. | British Library Online Contents | 1997

    Monte Carlo simulation of the EBIC grain boundary contrast in semiconductors

    Tabet, N. / Ledra, M. | British Library Online Contents | 1996

    Back to top