Reconstruction of recombination properties of extended defects in Si: Fid-Bau Portal

Reconstruction of recombination properties of extended defects in Si

Bondarenko, I. / Kononchuk, O. / Sirotkin, V. / Yakimov, E.

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Reconstruction of recombination properties of extended defects in Si

Bondarenko, I. / Kononchuk, O. / Sirotkin, V. / Yakimov, E.

Reconstruction of recombination properties of extended defects in Si

Bondarenko, I. / Kononchuk, O. / Sirotkin, V. / Yakimov, E.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Reconstruction of recombination properties of extended defects in Si

Contributors:

Bondarenko, I. (author) / Kononchuk, O. (author) / Sirotkin, V. (author) / Yakimov, E. (author) / Balkanski, M. / Kamimura, H. / Mahajan, S.

Published in:

Solid-State Materials for Advanced Technology ; 270-273

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 42

Publication date:

1996-01-01

Size:

4 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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