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Thickness dependence of refractive index for anodic aluminium oxide films

Chiu, R.-L. / Chang, P.-H.

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Thickness dependence of refractive index for anodic aluminium oxide films

Chiu, R.-L. / Chang, P.-H.

Thickness dependence of refractive index for anodic aluminium oxide films

Chiu, R.-L. / Chang, P.-H.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Thickness dependence of refractive index for anodic aluminium oxide films

Contributors:

Chiu, R.-L. (author) / Chang, P.-H. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE LETTERS ; 16 ; 174-178

Publication date:

1997-01-01

Size:

5 pages

ISSN:

0261-8028

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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