Raman characterization of Bi~1~2SiO~2~0 thin films obtained by pulsed laser deposition: Fid-Bau Portal

Raman characterization of Bi~1~2SiO~2~0 thin films obtained by pulsed laser deposition

Alonso, J. C. / Diamant, R. / Haro-Poniatowski, E. / Fernandez-Guasti, M. / Mu�oz, G. / Camarillo, I. / Jouanne, M. / Morhange, J. F.

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Raman characterization of Bi~1~2SiO~2~0 thin films obtained by pulsed laser deposition

Alonso, J. C. / Diamant, R. / Haro-Poniatowski, E. / Fernandez-Guasti, M. / Mu�oz, G. / Camarillo, I. / Jouanne, M. / Morhange, J. F.

Raman characterization of Bi~1~2SiO~2~0 thin films obtained by pulsed laser deposition

Alonso, J. C. / Diamant, R. / Haro-Poniatowski, E. / Fernandez-Guasti, M. / Mu�oz, G. / Camarillo, I. / Jouanne, M. / Morhange, J. F.

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Document information

Title:

Raman characterization of Bi~1~2SiO~2~0 thin films obtained by pulsed laser deposition

Contributors:

Alonso, J. C. (author) / Diamant, R. (author) / Haro-Poniatowski, E. (author) / Fernandez-Guasti, M. (author) / Mu�oz, G. (author) / Camarillo, I. (author) / Jouanne, M. (author) / Morhange, J. F. (author)

Published in:

APPLIED SURFACE SCIENCE ; 109/110 ; 359-361

Publication date:

1997-01-01

Size:

3 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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