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Optical and structural characterization of r.f. sputtered CeO~2 thin films

Bueno, R. M. / Martinez-Duart, J. M. / Hernandez-Velez, M. / Vazquez, L.

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Optical and structural characterization of r.f. sputtered CeO~2 thin films

Bueno, R. M. / Martinez-Duart, J. M. / Hernandez-Velez, M. / Vazquez, L.

Optical and structural characterization of r.f. sputtered CeO~2 thin films

Bueno, R. M. / Martinez-Duart, J. M. / Hernandez-Velez, M. / Vazquez, L.

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Check availability in my library

Order at Subito €

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Document information

Title:

Optical and structural characterization of r.f. sputtered CeO~2 thin films

Contributors:

Bueno, R. M. (author) / Martinez-Duart, J. M. (author) / Hernandez-Velez, M. (author) / Vazquez, L. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 32 ; 1861-1865

Publication date:

1997-01-01

Size:

5 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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