Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Optical and structural characterization of r.f. sputtered CeO~2 thin films
Optical and structural characterization of r.f. sputtered CeO~2 thin films
Optical and structural characterization of r.f. sputtered CeO~2 thin films
Bueno, R. M. (Autor:in) / Martinez-Duart, J. M. (Autor:in) / Hernandez-Velez, M. (Autor:in) / Vazquez, L. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 32 ; 1861-1865
01.01.1997
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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