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True atomic resolution imaging with noncontact atomic force microscopy
True atomic resolution imaging with noncontact atomic force microscopy
True atomic resolution imaging with noncontact atomic force microscopy
Sugawara, Y. (author) / Ueyama, H. (author) / Uchihashi, T. (author) / Ohta, M. (author) / Morita, S. (author) / Suzuki, M. (author) / Mishima, S. (author)
APPLIED SURFACE SCIENCE ; 113/114 ; 364-370
1997-01-01
7 pages
Article (Journal)
English
DDC:
621.35
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