The study of aging mechanism in ZnS:Mn thin-film electroluminescent devices grown by MOCVD: Fid-Bau Portal

The study of aging mechanism in ZnS:Mn thin-film electroluminescent devices grown by MOCVD

Wang, C. W. / Sheu, T. J. / Su, Y. K. / Yokoyama, M.

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The study of aging mechanism in ZnS:Mn thin-film electroluminescent devices grown by MOCVD

Wang, C. W. / Sheu, T. J. / Su, Y. K. / Yokoyama, M.

The study of aging mechanism in ZnS:Mn thin-film electroluminescent devices grown by MOCVD

Wang, C. W. / Sheu, T. J. / Su, Y. K. / Yokoyama, M.

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Check availability in my library

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Document information

Title:

The study of aging mechanism in ZnS:Mn thin-film electroluminescent devices grown by MOCVD

Contributors:

Wang, C. W. (author) / Sheu, T. J. (author) / Su, Y. K. (author) / Yokoyama, M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 113/114 ; 709-713

Publication date:

1997-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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