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    X-ray characterization of annealed Cu/Ni multilayers

    New search for: Jayakody, S.
    New search for: Chaudhuri, J.
    New search for: Jankowski, A. F.

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    X-ray characterization of annealed Cu/Ni multilayers

    New search for: Jayakody, S.
    New search for: Chaudhuri, J.
    New search for: Jankowski, A. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    X-ray characterization of annealed Cu/Ni multilayers

    New search for: Jayakody, S.
    New search for: Chaudhuri, J.
    New search for: Jankowski, A. F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    X-ray characterization of annealed Cu/Ni multilayers

    Contributors:

    Jayakody, S. (author) / Chaudhuri, J. (author) / Jankowski, A. F. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 32 ; 2605-2609

    Publication date:

    1997-01-01

    Size:

    5 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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