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Characterization of strain in annealed Cu-Ni multilayers using X-ray diffraction

Chaudhuri, J. / Low, K. / Jankowski, A. F.

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Characterization of strain in annealed Cu-Ni multilayers using X-ray diffraction

Chaudhuri, J. / Low, K. / Jankowski, A. F.

Characterization of strain in annealed Cu-Ni multilayers using X-ray diffraction

Chaudhuri, J. / Low, K. / Jankowski, A. F.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Characterization of strain in annealed Cu-Ni multilayers using X-ray diffraction

Contributors:

Chaudhuri, J. (author) / Low, K. (author) / Jankowski, A. F. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 33 ; 55-61

Publication date:

1998-01-01

Size:

7 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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