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Use of Scanning Electron Microscopy in the Detection of Flaws in Piezoelectric and Ferroelectric Crystals
Use of Scanning Electron Microscopy in the Detection of Flaws in Piezoelectric and Ferroelectric Crystals
Use of Scanning Electron Microscopy in the Detection of Flaws in Piezoelectric and Ferroelectric Crystals
Roshchupkin, D. V. (author) / Tkachev, S. V. (author)
INDUSTRIAL LABORATORY C/C OF ZAVODSKAIA LABORATORIIA ; 62 ; 501-503
1996-01-01
3 pages
Article (Journal)
English
DDC:
607.2
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