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    Positron beam analysis of semiconductor materials using a two-detector Doppler broadening coincidence system

    New search for: Kruseman, A. C.
    New search for: Schut, H.
    New search for: Van Veen, A.
    New search for: Mijnarends, P. E.
    New search for: Clement, M.
    New search for: De Nijs, J. M. M.

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    Positron beam analysis of semiconductor materials using a two-detector Doppler broadening coincidence system

    New search for: Kruseman, A. C.
    New search for: Schut, H.
    New search for: Van Veen, A.
    New search for: Mijnarends, P. E.
    New search for: Clement, M.
    New search for: De Nijs, J. M. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Positron beam analysis of semiconductor materials using a two-detector Doppler broadening coincidence system

    New search for: Kruseman, A. C.
    New search for: Schut, H.
    New search for: Van Veen, A.
    New search for: Mijnarends, P. E.
    New search for: Clement, M.
    New search for: De Nijs, J. M. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Positron beam analysis of semiconductor materials using a two-detector Doppler broadening coincidence system

    Contributors:

    Kruseman, A. C. (author) / Schut, H. (author) / Van Veen, A. (author) / Mijnarends, P. E. (author) / Clement, M. (author) / De Nijs, J. M. M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 116 ; 192-197

    Publication date:

    1997-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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