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Positron beam analysis of semiconductor materials using a two-detector Doppler broadening coincidence system
Positron beam analysis of semiconductor materials using a two-detector Doppler broadening coincidence system
Positron beam analysis of semiconductor materials using a two-detector Doppler broadening coincidence system
Kruseman, A. C. (author) / Schut, H. (author) / Van Veen, A. (author) / Mijnarends, P. E. (author) / Clement, M. (author) / De Nijs, J. M. M. (author)
APPLIED SURFACE SCIENCE ; 116 ; 192-197
1997-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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