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Investigation of band bending in silicon by slow positron lifetime measurements

Duffy, J. A. / Bauer-Kugelmann, W. / Koegel, G. / Triftshaeuser, W.

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Investigation of band bending in silicon by slow positron lifetime measurements

Duffy, J. A. / Bauer-Kugelmann, W. / Koegel, G. / Triftshaeuser, W.

Investigation of band bending in silicon by slow positron lifetime measurements

Duffy, J. A. / Bauer-Kugelmann, W. / Koegel, G. / Triftshaeuser, W.

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Document information

Title:

Investigation of band bending in silicon by slow positron lifetime measurements

Contributors:

Duffy, J. A. (author) / Bauer-Kugelmann, W. (author) / Koegel, G. (author) / Triftshaeuser, W. (author)

Published in:

APPLIED SURFACE SCIENCE ; 116 ; 241-246

Publication date:

1997-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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