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Positron Lifetime Measurements of Delta Doped MBE Grown Silicon Structures

Stoermer, J. / Willutzki, P. / Britton, D. T. / Triftshaeuser, W.

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Positron Lifetime Measurements of Delta Doped MBE Grown Silicon Structures

Stoermer, J. / Willutzki, P. / Britton, D. T. / Triftshaeuser, W.

Positron Lifetime Measurements of Delta Doped MBE Grown Silicon Structures

Stoermer, J. / Willutzki, P. / Britton, D. T. / Triftshaeuser, W.

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Check availability in my library

Order at Subito €

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Document information

Title:

Positron Lifetime Measurements of Delta Doped MBE Grown Silicon Structures

Contributors:

Stoermer, J. (author) / Willutzki, P. (author) / Britton, D. T. (author) / Triftshaeuser, W. (author) / He, Y.-J. / Cao, B.-S. / Jean, Y. C.

Published in:

Positron Annihilation ICPA-10 ; 213

MATERIALS SCIENCE FORUM

Publication date:

1995-01-01

Size:

213 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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