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Electroreflectance investigation of trapping states at SiO~2/GaAs interfaces
Electroreflectance investigation of trapping states at SiO~2/GaAs interfaces
Electroreflectance investigation of trapping states at SiO~2/GaAs interfaces
Mochizuki, Y. (author) / Mizuta, M. (author)
APPLIED SURFACE SCIENCE ; 117/118 ; 614-618
1997-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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