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Waveguide refractometry as a probe of thin film optical uniformity

Potter, B. G. / Dimos, D. / Sinclair, M. B.

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Waveguide refractometry as a probe of thin film optical uniformity

Potter, B. G. / Dimos, D. / Sinclair, M. B.

Waveguide refractometry as a probe of thin film optical uniformity

Potter, B. G. / Dimos, D. / Sinclair, M. B.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Waveguide refractometry as a probe of thin film optical uniformity

Contributors:

Potter, B. G. (author) / Dimos, D. (author) / Sinclair, M. B. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 12 ; 546-551

Publication date:

1997-01-01

Size:

6 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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