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    Characterization of nickel-copper multilayer and copper thin film using neutron reflectivity measurements

    New search for: Vedpathak, M.
    New search for: Basu, S.
    New search for: Kulkarni, S. K.

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    Characterization of nickel-copper multilayer and copper thin film using neutron reflectivity measurements

    New search for: Vedpathak, M.
    New search for: Basu, S.
    New search for: Kulkarni, S. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of nickel-copper multilayer and copper thin film using neutron reflectivity measurements

    New search for: Vedpathak, M.
    New search for: Basu, S.
    New search for: Kulkarni, S. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Characterization of nickel-copper multilayer and copper thin film using neutron reflectivity measurements

    Contributors:

    Vedpathak, M. (author) / Basu, S. (author) / Kulkarni, S. K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 115 ; 311-316

    Publication date:

    1997-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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