Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Characterization of nickel-copper multilayer and copper thin film using neutron reflectivity measurements
Characterization of nickel-copper multilayer and copper thin film using neutron reflectivity measurements
Characterization of nickel-copper multilayer and copper thin film using neutron reflectivity measurements
Vedpathak, M. (Autor:in) / Basu, S. (Autor:in) / Kulkarni, S. K. (Autor:in)
APPLIED SURFACE SCIENCE ; 115 ; 311-316
01.01.1997
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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