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Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry
Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry
Investigation of the Morphology of Porous Silicon by Rutherford Backscattering Spectrometry
Szilagyi, E. (author) / Hajnal, Z. (author) / Paszti, F. (author) / Buiu, O. (author) / Craciun, G. (author) / Cobianu, C. (author) / Savaniu, C. (author) / Vazsonyi, E. (author) / Balogh, A. G. / Walter, G.
1997-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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