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Application of Weibull distribution analysis to the dielectric failure of multilayer ceramic capacitors
Application of Weibull distribution analysis to the dielectric failure of multilayer ceramic capacitors
Application of Weibull distribution analysis to the dielectric failure of multilayer ceramic capacitors
Wang, Y. (author) / Chan, Y. C. (author) / Gui, Z. L. (author) / Webb, D. P. (author) / Li, L. T. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 47 ; 197-203
1997-01-01
7 pages
Article (Journal)
English
DDC:
620.11
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Copper electrodes multilayer ceramic capacitors Part I The dielectric composition
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