Emission of an Edge Dislocation from a Thin-Film-Covered Crack: Fid-Bau Portal

Emission of an Edge Dislocation from a Thin-Film-Covered Crack

Qian, C.-F. / Zhang, T.-Y. / Tong, P.

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Emission of an Edge Dislocation from a Thin-Film-Covered Crack

Qian, C.-F. / Zhang, T.-Y. / Tong, P.

Emission of an Edge Dislocation from a Thin-Film-Covered Crack

Qian, C.-F. / Zhang, T.-Y. / Tong, P.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Emission of an Edge Dislocation from a Thin-Film-Covered Crack

Contributors:

Qian, C.-F. (author) / Zhang, T.-Y. (author) / Tong, P. (author) / Tong, P. / Zhang, T. Y. / Kim, J. K.

Published in:

Fracture and Strength of Solids - Part 1: Fracture Mechanics of Materials ; 161-166

KEY ENGINEERING MATERIALS

Publication date:

1998-01-01

Size:

6 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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