Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy: Fid-Bau Portal

Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy

Koinkar, V. N. / Bhushan, B.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy

Koinkar, V. N. / Bhushan, B.

Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy

Koinkar, V. N. / Bhushan, B.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy

Contributors:

Koinkar, V. N. (author) / Bhushan, B. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 12 ; 3219-3224

Publication date:

1997-01-01

Size:

6 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

British Library Online Contents | 2007

Atomic force and magnetic force microscopies applied to duplex stainless steels

Dias, A. / Andrade, M. S. | British Library Online Contents | 2000

In-Situ Microscopy in Materials Research : Leading International Research in Electron and Scanning Probe Microscopies

Gai, Pratibha L. | TIBKAT | 1997

Growth study of silicon nanowires by electron microscopies

Reguer, A. / Dallaporta, H. | British Library Online Contents | 2009

Atomic Force Microscopy/Scanning Tunneling Microscopy

Cohen, Samuel H. | TIBKAT | 1994