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    A Tapered Double-Cantilever-Beam Specimen Designed for Constant-K Testing at Elevated Temperatures

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    New search for: Koul, A. K.
    New search for: Thamburaj, R.

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    A Tapered Double-Cantilever-Beam Specimen Designed for Constant-K Testing at Elevated Temperatures

    New search for: Beres, W.
    New search for: Koul, A. K.
    New search for: Thamburaj, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A Tapered Double-Cantilever-Beam Specimen Designed for Constant-K Testing at Elevated Temperatures

    New search for: Beres, W.
    New search for: Koul, A. K.
    New search for: Thamburaj, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    A Tapered Double-Cantilever-Beam Specimen Designed for Constant-K Testing at Elevated Temperatures

    Contributors:

    Beres, W. (author) / Koul, A. K. (author) / Thamburaj, R. (author)

    Published in:

    JOURNAL OF TESTING AND EVALUATION ; 25 ; 536-542

    Publication date:

    1997-01-01

    Size:

    7 pages

    ISSN:

    0090-3973

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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