Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Homogeneity of Fe-Doped InP Wafers Using Optical Microprobes

    New search for: Sanz, L. F.
    New search for: Gonzalez, M. A.
    New search for: Avella, M.
    New search for: Alvarez, A.
    New search for: Jimenez, J.
    New search for: Fornari, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Homogeneity of Fe-Doped InP Wafers Using Optical Microprobes

    New search for: Sanz, L. F.
    New search for: Gonzalez, M. A.
    New search for: Avella, M.
    New search for: Alvarez, A.
    New search for: Jimenez, J.
    New search for: Fornari, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Homogeneity of Fe-Doped InP Wafers Using Optical Microprobes

    New search for: Sanz, L. F.
    New search for: Gonzalez, M. A.
    New search for: Avella, M.
    New search for: Alvarez, A.
    New search for: Jimenez, J.
    New search for: Fornari, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Homogeneity of Fe-Doped InP Wafers Using Optical Microprobes

    Contributors:

    Sanz, L. F. (author) / Gonzalez, M. A. (author) / Avella, M. (author) / Alvarez, A. (author) / Jimenez, J. (author) / Fornari, R. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 258/263 ; 825-830

    Publication date:

    1997-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Homogeneity of thermally annealed Fe-doped InP wafers

    Fornari, R. / Gilioli, E. / Sentiri, A. et al. | British Library Online Contents | 1997

    Microscopes/microprobes

    Kogel, G. | British Library Online Contents | 2002

    Positron Microprobes

    Triftshauser, W. | British Library Online Contents | 2004

    Conductive Carbon Nanotube Composite Microprobes

    Yaglioglu, O. / Martens, R. / Hart, A. J. et al. | British Library Online Contents | 2008

    High Energy Ion Microprobes: Where are we going ?

    Butz, T. / Flagmeyer, R.-H. | British Library Online Contents | 1997

    Back to top