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High Resolution Photoemission Spectroscopy Using Synchrotron Radiation Study of the SiO~2/-SiC(100)3x2 Interface Composition
High Resolution Photoemission Spectroscopy Using Synchrotron Radiation Study of the SiO~2/-SiC(100)3x2 Interface Composition
High Resolution Photoemission Spectroscopy Using Synchrotron Radiation Study of the SiO~2/-SiC(100)3x2 Interface Composition
Dunham, D. (author) / Soukiassian, P. (author) / Denlinger, J. D. (author) / Tonner, B. P. (author) / Rothenberg, E. (author) / Pensl, G. / Morkoc, H. / Monemar, B. / Janzen, E.
1998-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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