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    Positron Beam Studies of Defects in Semiconductors

    New search for: Krause-Rehberg, R.
    New search for: Borner, F.
    New search for: Redmann, F.

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    Positron Beam Studies of Defects in Semiconductors

    New search for: Krause-Rehberg, R.
    New search for: Borner, F.
    New search for: Redmann, F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Positron Beam Studies of Defects in Semiconductors

    New search for: Krause-Rehberg, R.
    New search for: Borner, F.
    New search for: Redmann, F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Positron Beam Studies of Defects in Semiconductors

    Contributors:

    Krause-Rehberg, R. (author) / Borner, F. (author) / Redmann, F. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 363/365 ; 404-408

    Publication date:

    2001-01-01

    Size:

    5 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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