Structural Defects and Photoluminescence in Dislocation-Rich Erbium-Doped Silicon: Fid-Bau Portal

Structural Defects and Photoluminescence in Dislocation-Rich Erbium-Doped Silicon

Vdovin, V. I. / Sobolev, N. A. / Emel'yanov, E. M. / Gusev, O. B. / Shek, E. I. / Yugova, T. G.

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Structural Defects and Photoluminescence in Dislocation-Rich Erbium-Doped Silicon

Vdovin, V. I. / Sobolev, N. A. / Emel'yanov, E. M. / Gusev, O. B. / Shek, E. I. / Yugova, T. G.

Structural Defects and Photoluminescence in Dislocation-Rich Erbium-Doped Silicon

Vdovin, V. I. / Sobolev, N. A. / Emel'yanov, E. M. / Gusev, O. B. / Shek, E. I. / Yugova, T. G.

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Document information

Title:

Structural Defects and Photoluminescence in Dislocation-Rich Erbium-Doped Silicon

Contributors:

Vdovin, V. I. (author) / Sobolev, N. A. (author) / Emel'yanov, E. M. (author) / Gusev, O. B. (author) / Shek, E. I. (author) / Yugova, T. G. (author) / Davies, G. / Nazare, M. H.

Published in:

Defects in Semiconductors ICDS-19 ; 1521-1526

MATERIALS SCIENCE FORUM ; 258/263

Publication date:

1997-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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