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Ionized impurity scattering in isotopically engineered, compensated Ge:Ga,As

Itoh, K. M. / Kinoshita, T. / Walukiewicz, W. / Beeman, J. W. / Haller, E. E. / Muto, J. / Farmer, J. W. / Ozhogin, V. I.

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Ionized impurity scattering in isotopically engineered, compensated Ge:Ga,As

Itoh, K. M. / Kinoshita, T. / Walukiewicz, W. / Beeman, J. W. / Haller, E. E. / Muto, J. / Farmer, J. W. / Ozhogin, V. I.

Ionized impurity scattering in isotopically engineered, compensated Ge:Ga,As

Itoh, K. M. / Kinoshita, T. / Walukiewicz, W. / Beeman, J. W. / Haller, E. E. / Muto, J. / Farmer, J. W. / Ozhogin, V. I.

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Title:

Ionized impurity scattering in isotopically engineered, compensated Ge:Ga,As

Contributors:

Itoh, K. M. (author) / Kinoshita, T. (author) / Walukiewicz, W. (author) / Beeman, J. W. (author) / Haller, E. E. (author) / Muto, J. (author) / Farmer, J. W. (author) / Ozhogin, V. I. (author)

Published in:

MATERIALS SCIENCE FORUM ; 258/263 ; 77-82

Publication date:

1997-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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