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Ionized impurity scattering in isotopically engineered, compensated Ge:Ga,As
Ionized impurity scattering in isotopically engineered, compensated Ge:Ga,As
Ionized impurity scattering in isotopically engineered, compensated Ge:Ga,As
Itoh, K. M. (Autor:in) / Kinoshita, T. (Autor:in) / Walukiewicz, W. (Autor:in) / Beeman, J. W. (Autor:in) / Haller, E. E. (Autor:in) / Muto, J. (Autor:in) / Farmer, J. W. (Autor:in) / Ozhogin, V. I. (Autor:in)
MATERIALS SCIENCE FORUM ; 258/263 ; 77-82
01.01.1997
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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