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    Cadmium-related defects in silicon: electron-paramagnetic resonance identification

    New search for: Gehlhoff, W.
    New search for: Naeser, A.
    New search for: Lang, M.
    New search for: Pensl, G.

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    Cadmium-related defects in silicon: electron-paramagnetic resonance identification

    New search for: Gehlhoff, W.
    New search for: Naeser, A.
    New search for: Lang, M.
    New search for: Pensl, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Cadmium-related defects in silicon: electron-paramagnetic resonance identification

    New search for: Gehlhoff, W.
    New search for: Naeser, A.
    New search for: Lang, M.
    New search for: Pensl, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Cadmium-related defects in silicon: electron-paramagnetic resonance identification

    Contributors:

    Gehlhoff, W. (author) / Naeser, A. (author) / Lang, M. (author) / Pensl, G. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 258/263 ; 423-428

    Publication date:

    1997-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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