Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Isolated substitutional silver and silver-induced defects in silicon: an electron paramagnetic resonance investigation

    New search for: Hai, P. N.
    New search for: Gregorkiewicz, T.
    New search for: Ammerlaan, C. A. J.
    New search for: Don, D. T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Isolated substitutional silver and silver-induced defects in silicon: an electron paramagnetic resonance investigation

    New search for: Hai, P. N.
    New search for: Gregorkiewicz, T.
    New search for: Ammerlaan, C. A. J.
    New search for: Don, D. T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Isolated substitutional silver and silver-induced defects in silicon: an electron paramagnetic resonance investigation

    New search for: Hai, P. N.
    New search for: Gregorkiewicz, T.
    New search for: Ammerlaan, C. A. J.
    New search for: Don, D. T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Isolated substitutional silver and silver-induced defects in silicon: an electron paramagnetic resonance investigation

    Contributors:

    Hai, P. N. (author) / Gregorkiewicz, T. (author) / Ammerlaan, C. A. J. (author) / Don, D. T. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 258/263 ; 491-496

    Publication date:

    1997-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Cadmium-related defects in silicon: electron-paramagnetic resonance identification

    Gehlhoff, W. / Naeser, A. / Lang, M. et al. | British Library Online Contents | 1997

    Electron paramagnetic resonance measurements on porous silicon

    Nakamura, T. / Sasaki, K. / Hayashi, K. et al. | British Library Online Contents | 1996

    Electron paramagnetic resonance study of defects in rapid thermal chemical vapor deposited polycrystalline silicon

    Grozdanic, D. / Rakvin, B. / Pivac, B. et al. | British Library Online Contents | 2000

    An Electron Paramagnetic Resonance Study of Defects in Semiconducting Iron Disilicide

    Irmscher, K. / Gehlhoff, W. / Tomm, Y. et al. | British Library Online Contents | 1995

    Electron paramagnetic resonance measurements on activated silicon nitride powders

    Boden, G. / Bartl, A. / Koch, W. | British Library Online Contents | 1993

    Back to top