Submicron Deformation Field Measurements: Part 1. Developing a Digital Scanning Tunneling Microscope: Fid-Bau Portal

Submicron Deformation Field Measurements: Part 1. Developing a Digital Scanning Tunneling Microscope

Vendroux, G. / Knauss, W. G.

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Submicron Deformation Field Measurements: Part 1. Developing a Digital Scanning Tunneling Microscope

Vendroux, G. / Knauss, W. G.

Submicron Deformation Field Measurements: Part 1. Developing a Digital Scanning Tunneling Microscope

Vendroux, G. / Knauss, W. G.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Submicron Deformation Field Measurements: Part 1. Developing a Digital Scanning Tunneling Microscope

Contributors:

Vendroux, G. (author) / Knauss, W. G. (author)

Published in:

EXPERIMENTAL MECHANICS ; 38 ; 18-23

Publication date:

1998-01-01

Size:

6 pages

ISSN:

0014-4851

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1

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