Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Full-field Thermal Deformation Measurements in a Scanning Electron Microscope by 2D Digital Image Correlation

    New search for: Li, N.
    New search for: Sutton, M. A.
    New search for: Li, X.
    New search for: Schreier, H. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Full-field Thermal Deformation Measurements in a Scanning Electron Microscope by 2D Digital Image Correlation

    New search for: Li, N.
    New search for: Sutton, M. A.
    New search for: Li, X.
    New search for: Schreier, H. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Full-field Thermal Deformation Measurements in a Scanning Electron Microscope by 2D Digital Image Correlation

    New search for: Li, N.
    New search for: Sutton, M. A.
    New search for: Li, X.
    New search for: Schreier, H. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Full-field Thermal Deformation Measurements in a Scanning Electron Microscope by 2D Digital Image Correlation

    Contributors:

    Li, N. (author) / Sutton, M. A. (author) / Li, X. (author) / Schreier, H. W. (author)

    Published in:

    EXPERIMENTAL MECHANICS ; 48 ; 635-646

    Publication date:

    2008-01-01

    Size:

    12 pages

    ISSN:

    0014-4851

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Micro-scale deformation measurement using the digital image correlation technique and scanning electron microscope imaging

    Jin, H. / Lu, W.-Y. / Korellis, J. | British Library Online Contents | 2008

    Submicron Deformation Field Measurements: Part 1. Developing a Digital Scanning Tunneling Microscope

    Vendroux, G. / Knauss, W. G. | British Library Online Contents | 1998

    ERROR ANALYSIS OF DIGITAL SPECKLE CORRELATION METHOD UNDER SCANNING ELECTRON MICROSCOPE

    British Library Online Contents | 2006

    Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope

    Kammers, A. D. / Daly, S. | British Library Online Contents | 2013

    Submicron Deformation Field Measurements Part 2. Improved Digital Image Correlation

    Vendroux, G. / Knauss, W. G. | British Library Online Contents | 1998

    Back to top