Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    The deposition of TiO~2 thin films on self-assembly monolayers studied by X-ray photoelectron spectroscopy

    New search for: Xiao, Z.
    New search for: Gu, J.
    New search for: Huang, D.
    New search for: Lu, Z.
    New search for: Wei, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    The deposition of TiO~2 thin films on self-assembly monolayers studied by X-ray photoelectron spectroscopy

    New search for: Xiao, Z.
    New search for: Gu, J.
    New search for: Huang, D.
    New search for: Lu, Z.
    New search for: Wei, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The deposition of TiO~2 thin films on self-assembly monolayers studied by X-ray photoelectron spectroscopy

    New search for: Xiao, Z.
    New search for: Gu, J.
    New search for: Huang, D.
    New search for: Lu, Z.
    New search for: Wei, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    The deposition of TiO~2 thin films on self-assembly monolayers studied by X-ray photoelectron spectroscopy

    Contributors:

    Xiao, Z. (author) / Gu, J. (author) / Huang, D. (author) / Lu, Z. (author) / Wei, Y. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 125 ; 85-92

    Publication date:

    1998-01-01

    Size:

    8 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Composition depth profiles of Bi3.15Nd0.85Ti3O12 thin films studied by X-ray photoelectron spectroscopy

    Zhang, Z. H. / Zhong, X. L. / Liao, H. et al. | British Library Online Contents | 2011

    X-ray Photoelectron Spectroscopy Applications In Thin Films Research

    Geng, S. / Zhang, S. / Onishi, H. | British Library Online Contents | 2002

    In-doped As2Se3 thin films studied by Raman and X-ray photoelectron spectroscopies

    Azhniuk, Yuriy / Dzhagan, Volodymyr / Solonenko, Dmytro et al. | British Library Online Contents | 2019

    Properties of BiFeO~3 Thin Films Prepared with Self-Assembled Monolayers by Liquid Phase Deposition

    Yin, J. / Tan, G.Q. / Song, L.H. et al. | British Library Online Contents | 2012

    Zirconia/metal interfaces studied by X-ray photoelectron spectroscopy

    Mariot, J.-M. / Harel, S. / Hague, C. F. | British Library Online Contents | 1993

    Back to top