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    Composition depth profiles of Bi3.15Nd0.85Ti3O12 thin films studied by X-ray photoelectron spectroscopy

    New search for: Zhang, Z. H.
    New search for: Zhong, X. L.
    New search for: Liao, H.
    New search for: Wang, F.
    New search for: Wang, J. B.
    New search for: Zhou, Y. C.

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    Composition depth profiles of Bi3.15Nd0.85Ti3O12 thin films studied by X-ray photoelectron spectroscopy

    New search for: Zhang, Z. H.
    New search for: Zhong, X. L.
    New search for: Liao, H.
    New search for: Wang, F.
    New search for: Wang, J. B.
    New search for: Zhou, Y. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Composition depth profiles of Bi3.15Nd0.85Ti3O12 thin films studied by X-ray photoelectron spectroscopy

    New search for: Zhang, Z. H.
    New search for: Zhong, X. L.
    New search for: Liao, H.
    New search for: Wang, F.
    New search for: Wang, J. B.
    New search for: Zhou, Y. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Composition depth profiles of Bi3.15Nd0.85Ti3O12 thin films studied by X-ray photoelectron spectroscopy

    Contributors:

    Zhang, Z. H. (author) / Zhong, X. L. (author) / Liao, H. (author) / Wang, F. (author) / Wang, J. B. (author) / Zhou, Y. C. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 257 ; 7461-7465

    Publication date:

    2011-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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