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    Characterization of quantum structures by atomic-force microscopy

    New search for: Wullner, D.
    New search for: Schlachetzki, A.
    New search for: Bonsch, P.
    New search for: Wehmann, H.-H.
    New search for: Schrimpf, T.
    New search for: Lacmann, R.
    New search for: Kipp, S.

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    Characterization of quantum structures by atomic-force microscopy

    New search for: Wullner, D.
    New search for: Schlachetzki, A.
    New search for: Bonsch, P.
    New search for: Wehmann, H.-H.
    New search for: Schrimpf, T.
    New search for: Lacmann, R.
    New search for: Kipp, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of quantum structures by atomic-force microscopy

    New search for: Wullner, D.
    New search for: Schlachetzki, A.
    New search for: Bonsch, P.
    New search for: Wehmann, H.-H.
    New search for: Schrimpf, T.
    New search for: Lacmann, R.
    New search for: Kipp, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Characterization of quantum structures by atomic-force microscopy

    Contributors:

    Wullner, D. (author) / Schlachetzki, A. (author) / Bonsch, P. (author) / Wehmann, H.-H. (author) / Schrimpf, T. (author) / Lacmann, R. (author) / Kipp, S. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 51 ; 178-187

    Publication date:

    1998-01-01

    Size:

    10 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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