A platform for research: civil engineering, architecture and urbanism
A Polycrystalline Thin Film Diffractometer for Asymmetric Diffraction using Parallel Beam and High Resolution Parallel Slits
A Polycrystalline Thin Film Diffractometer for Asymmetric Diffraction using Parallel Beam and High Resolution Parallel Slits
A Polycrystalline Thin Film Diffractometer for Asymmetric Diffraction using Parallel Beam and High Resolution Parallel Slits
Toraya, H. (author) / Yoshino, J. (author)
ADVANCES IN X RAY ANALYSIS ; 165-170
1997-01-01
6 pages
Article (Journal)
English
DDC:
539.7222
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
The Effects of Using Long Soller Slits as "Parallel Beam Optics" for GIXRD on Diffraction Data
British Library Online Contents | 1994
|Research on Influence of Diffractometer Slits on XRD Pattern
British Library Online Contents | 2013
|Asymmetric Diffraction with Parallel-Beam Synchrotron Radiation
British Library Online Contents | 1993
|Characterization of Epitaxial High Tc Superconductors Using a Parallel Beam X-Ray Diffractometer
British Library Online Contents | 1993
|Analytical Comparison of Parallel Beam and Bragg-Brentano Diffractometer Performances
British Library Online Contents | 2004
|