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    Characterization of Epitaxial High Tc Superconductors Using a Parallel Beam X-Ray Diffractometer

    New search for: Houtman, E.
    New search for: Ryan, T. W.
    New search for: David, B.
    New search for: Doormann, V.

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    Characterization of Epitaxial High Tc Superconductors Using a Parallel Beam X-Ray Diffractometer

    New search for: Houtman, E.
    New search for: Ryan, T. W.
    New search for: David, B.
    New search for: Doormann, V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of Epitaxial High Tc Superconductors Using a Parallel Beam X-Ray Diffractometer

    New search for: Houtman, E.
    New search for: Ryan, T. W.
    New search for: David, B.
    New search for: Doormann, V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Characterization of Epitaxial High Tc Superconductors Using a Parallel Beam X-Ray Diffractometer

    Contributors:

    Houtman, E. (author) / Ryan, T. W. (author) / David, B. (author) / Doormann, V. (author)

    Published in:

    ADVANCES IN X RAY ANALYSIS ; 205

    Publication date:

    1993-01-01

    Size:

    205 pages

    ISSN:

    0376-0308

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  539.7222

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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