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    Ballistic electron emission microscopy studies of Au/CaF~2/n-Si(111) interfaces

    New search for: Sumiya, T.
    New search for: Fujinuma, H.
    New search for: Miura, T.
    New search for: Tanaka, S.-I.

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    Ballistic electron emission microscopy studies of Au/CaF~2/n-Si(111) interfaces

    New search for: Sumiya, T.
    New search for: Fujinuma, H.
    New search for: Miura, T.
    New search for: Tanaka, S.-I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ballistic electron emission microscopy studies of Au/CaF~2/n-Si(111) interfaces

    New search for: Sumiya, T.
    New search for: Fujinuma, H.
    New search for: Miura, T.
    New search for: Tanaka, S.-I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Ballistic electron emission microscopy studies of Au/CaF~2/n-Si(111) interfaces

    Contributors:

    Sumiya, T. (author) / Fujinuma, H. (author) / Miura, T. (author) / Tanaka, S.-I. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 130-132 ; 36-40

    Publication date:

    1998-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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