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Ballistic electron emission microscopy studies of Au/CaF~2/n-Si(111) interfaces
Ballistic electron emission microscopy studies of Au/CaF~2/n-Si(111) interfaces
Ballistic electron emission microscopy studies of Au/CaF~2/n-Si(111) interfaces
Sumiya, T. (Autor:in) / Fujinuma, H. (Autor:in) / Miura, T. (Autor:in) / Tanaka, S.-I. (Autor:in)
APPLIED SURFACE SCIENCE ; 130-132 ; 36-40
01.01.1998
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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